Biographical Sketch of Prof. Sheldon X.-D. Tan

Dr. Sheldon Tan is a Full Professor in the Department of Electrical Engineering, University of California at Riverside. He is the Associate Director of Compute Engineering Program (CEN) at Bourn College of Engineering at UC Riverside since 2009. He also is a cooperative faculty member in the Department of Computer Science and Engineering at UCR. He received his B.S. and M.S. degrees in electrical engineering from Fudan University, Shanghai, China in 1992 and 1995, respectively and the Ph.D. degree in electrical and computer engineering from the University of Iowa, Iowa City, in 1999.

He was a faculty member in Department of Electrical Engineering, Fudan University from 1995 to 1996. He worked for Monterey Design Systems Inc. (now Synopysis), CA, from 1999 to 2001 and Altera Corporation CA, from 2001 to 2002. Since 2002, he has been with the Department of Electrical Engineering, University of California at Riverside, CA. Prof. Tan is a Visiting Professor of Fudan University and Tsinghua University, China and a Chaired Guest Professor of  Shanghai Jiaotong University and University of Electronic Science and Technology of China, China.

Dr. Tan research interests include several aspects of design automation for VLSI integrated circuits – (1) Parallel and intelligent computing (deep learning) and analysis on heterogeneous and accelerator-rich (GPUs) platforms; (2) Hardware security and trust computing; (3) Smart devices and embedded and cyber-physical systems; (4) VLSI reliability, modeling, optimization and management at circuit and system levels; (5) Thermal modeling, optimization and dynamic thermal management at circuit, chip and board levels; (6) Statistical modeling and optimization for VLSI systems. He has published over 220 journal and conference papers and gave over 80 invited presentations, tutorials and short courses at conferences and workshops. He co-authored four books: Symbolic Analysis and Reduction of VLSI Circuits published by Springer/Kluwer in 2005, Advanced Model Order Reduction Techniques for VLSI Designs by Cambridge University Press published in 2007; Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Design by Springer Publishing in 2012 and Advanced Symbolic Analysis for VLSI Systems -- Methods and Applications, Springer in 2014.

He received Outstanding Oversea Investigator Award (杰青-B)  CAREER Award in 2004. Dr. Tan received the Best Paper Award from 2007 IEEE International Conference on Computer Design (from the National Natural Science Foundation of China (NSFC) in 2008. Dr. Tan received NSF CAREER Award in 2004. Dr. Tan received the Best Paper Award from 2007 IEEE International Conference on Computer Design (ICCD’07), the Best Paper Award from 1999 IEEE/ACM Design Automation Conference and the Best Poster Award from 1999 Spring Meeting of the NSF Center for Design of Analog and Digital Integrated Circuits (CDADIC). He also receives three Best Paper Award Nomination from IEEE/ACM Design Automation Conferences in 2005, 2009 and 2014 and one Best Paper Award nomination from ASPDAC in 2015. He received the UC Regent’s Faculty Fellowship in 2004 and 2006 and Academic Senate COR (committee on Research) Fellowship from UCR in 2008 and 2013. One of his papers was one of Top 10 of Downloaded Articles in ACM Transaction on Design Automation of Electronic Systems (TODAES) in 2010. He also received the Best Graduate Award and a number of Excellent College Student Scholarships from Fudan University.

Dr. Tan now is serving as an Associate Editor for three journals: IEEE Transaction on VLSI Systems (TVLSI), ACM Transaction on Design Automation of Electronic Systems (TODAE), Integration, The VLSI Journal. He is a technical program committee member of DAC, ICCAD, ISLPED, ASPDAC, ICCD, ISQED. Dr. Tan is a senior member of IEEE. He holds one patent, two provisional patents in United States and 5 patents in China.

IEEE style Biographical Sketch of Prof. Sheldon X.-D. Tan

{Sheldon X.-D. Tan} (S’96-M’99-SM’06) received his B.S. and M.S. degrees in electrical engineering from Fudan University, Shanghai, China in 1992 and 1995, respectively and the Ph.D. degree in electrical and computer engineering from the University of Iowa, Iowa City, in 1999. He is a Professor in the Department of Electrical Engineering, University of California, Riverside, CA. He is the Associate Director of Compute Engineering Program (CEN) at Bourn College of Engineering at UC Riverside since 2009. He also is a cooperative faculty member in the Department of Computer Science and Engineering at UCR.

His research interests include: (1) Parallel and intelligent computing (deep learning) and analysis on heterogeneous and accelerator-rich (GPUs) platforms; (2) Hardware security and trust computing; (3) Smart devices and embedded and cyber-physical systems; (4) VLSI reliability, modeling, optimization and management at circuit and system levels; (5) Thermal modeling, optimization and dynamic thermal management at circuit, chip and board levels; (6) Statistical modeling and optimization for VLSI systems. He co-authored four books: Symbolic Analysis and Reduction of VLSI Circuits published by Springer/Kluwer in 2005, Advanced Model Order Reduction Techniques for VLSI Designs by Cambridge University Press published in 2007; Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Design by Springer Publishing in 2012 and Advanced Symbolic Analysis for VLSI Systems -- Methods and Applications, Springer in 2014.

Dr. Tan received Outstanding Oversea Investigator Award from the National Natural Science Foundation of China (NSFC) in 2008. He received NSF CAREER Award in 2004. He received NSF CAREER Award in 2004. Dr. Tan received the Best Paper Award from 2007 IEEE International Conference on Computer Design (ICCD'07), the Best Paper Award from 1999 IEEE/ACM Design Automation Conference. He also receives three Best Paper Award Nomination from IEEE/ACM Design Automation Conferences in 2005, 2009 and 2014 and one Best Paper Award nomination from ASPDAC in 2015.

Dr. Tan now is serving as an Associate Editor for three journals: IEEE Transaction on VLSI Systems (TVLSI), ACM Transaction on Design Automation of Electronic Systems (TODAE), Integration, The VLSI Journal. He is a technical program committee member of DAC, ICCAD, ISLPED, ASPDAC, ICCD, ISQED. Dr. Tan is a senior member of IEEE.